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1 Ergebnisse
1
ab initio simulation on mono-layer MoS2 tunnel FET: Impact ..:
, In:
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
,
Jiang, Xiang-Wei
;
Lv, Juan
;
Luo, Jun-Wei
... - p. 486-488 , 2016
Link:
https://doi.org/10.1109/ICSICT.2016.7998958
RT T1
2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT)
: T1
ab initio simulation on mono-layer MoS2 tunnel FET: Impact of metal contact configuration and defect assisted tunneling
UL https://suche.suub.uni-bremen.de/peid=ieee-7998958&Exemplar=1&LAN=DE A1 Jiang, Xiang-Wei A1 Lv, Juan A1 Luo, Jun-Wei A1 Li, Shu-Shen A1 Gong, Jian A1 Wang, Lin-Wang YR 2016 K1 Photonic band gap K1 Logic gates K1 Ions K1 TFETs SP 486 OP 488 LK http://dx.doi.org/https://doi.org/10.1109/ICSICT.2016.7998958 DO https://doi.org/10.1109/ICSICT.2016.7998958 SF ELIB - SuUB Bremen
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