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ab initio simulation on mono-layer MoS2 tunnel FET: Impact ..:

, In: 2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT),
Jiang, Xiang-Wei ; Lv, Juan ; Luo, Jun-Wei... - p. 486-488 , 2016
Link: https://doi.org/10.1109/ICSICT.2016.7998958