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Memristor device characterization by scanning microwave mic..:
, In:
2017 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)
,
Sassine, G.
;
Najjari, N.
;
Defrance, N.
... - p. None , 2017
Link:
https://doi.org/10.1109/MARSS.2017.8016537
RT T1 <cTitle>2017 International Conference on Manipulation, Automation and Robotics at Small Scales (MARSS)</cTitle>: T1 <Title>Memristor device characterization by scanning microwave microscopy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8016537&Exemplar=1&LAN=DE A1 Sassine, G. A1 Najjari, N. A1 Defrance, N. A1 Hanssler, O.C. A1 Theron, D. A1 Alibart, F. A1 Haddadi, K. YR 2017 K1 Microwave measurement K1 Microwave imaging K1 Microscopy K1 Microwave devices K1 Capacitance K1 Reflection coefficient K1 Oxide based random access memory (OxRAM) K1 memristor K1 scanning microwave microscopy K1 atomic forcemicroscopy K1 interferometry K1 metal oxide semiconductorcapacitors SP None LK http://dx.doi.org/https://doi.org/10.1109/MARSS.2017.8016537 DO https://doi.org/10.1109/MARSS.2017.8016537 SF ELIB - SuUB Bremen
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