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1 Ergebnisse
1
The degradation of high power gallium nitride light-emittin..:
, In:
2017 18th International Conference on Electronic Packaging Technology (ICEPT)
,
He, Piao Piao
;
Zhou, Ji Peng
;
Yin, Lu Qiao
- p. 440-443 , 2017
Link:
https://doi.org/10.1109/ICEPT.2017.8046489
RT T1 <cTitle>2017 18th International Conference on Electronic Packaging Technology (ICEPT)</cTitle>: T1 <Title>The degradation of high power gallium nitride light-emitting diodes</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8046489&Exemplar=1&LAN=DE A1 He, Piao Piao A1 Zhou, Ji Peng A1 Yin, Lu Qiao YR 2017 K1 Gallium nitride K1 high power LED K1 degradation K1 defect concentration SP 440 OP 443 LK http://dx.doi.org/https://doi.org/10.1109/ICEPT.2017.8046489 DO https://doi.org/10.1109/ICEPT.2017.8046489 SF ELIB - SuUB Bremen
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