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1 Ergebnisse
1
Numerical simulation of the wire bonding reliability of IGB..:
, In:
2017 18th International Conference on Electronic Packaging Technology (ICEPT)
,
Bie, Xiaorui
;
Qin, Fei
;
An, Tong
.. - p. 1396-1401 , 2017
Link:
https://doi.org/10.1109/ICEPT.2017.8046696
RT T1
2017 18th International Conference on Electronic Packaging Technology (ICEPT)
: T1
Numerical simulation of the wire bonding reliability of IGBT module under power cycling
UL https://suche.suub.uni-bremen.de/peid=ieee-8046696&Exemplar=1&LAN=DE A1 Bie, Xiaorui A1 Qin, Fei A1 An, Tong A1 Zhao, Jingyi A1 Fang, Chao YR 2017 K1 Insulated gate bipolar transistors K1 Thermal stresses K1 Thermal conductivity K1 Silicon K1 Artificial intelligence K1 Reliability K1 Computational modeling K1 IGBT K1 Wire bonding K1 Power cycling SP 1396 OP 1401 LK http://dx.doi.org/https://doi.org/10.1109/ICEPT.2017.8046696 DO https://doi.org/10.1109/ICEPT.2017.8046696 SF ELIB - SuUB Bremen
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