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Xtarp: Improving the Tented Arch Reference Point Detection ..:

, In: 2017 International Conference of the Biometrics Special Interest Group (BIOSIG),
Merkle, Johannes ; Tams, Benjamin ; Dieckmann, Benjamin. - p. 1-7 , 2017
Link: https://doi.org/10.23919/BIOSIG.2017.8053525