I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Advanced TEM sample preparation and imaging techniques in s..:

, In: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA),
Shen, Yi Qiang ; Zhu, Jie ; Tahmasebi, Taiebeh... - p. 1-6 , 2017
Link: https://doi.org/10.1109/IPFA.2017.8060140