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1 Ergebnisse
1
Si nano-particle characterization by atomic force microscop..:
, In:
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
,
Tan, Hao
;
Zhu, Jie
;
Zhao, Yu Zhe
... - p. 1-4 , 2017
Link:
https://doi.org/10.1109/IPFA.2017.8060187
RT T1
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
: T1
Si nano-particle characterization by atomic force microscopy and electronic beam techniques
UL https://suche.suub.uni-bremen.de/peid=ieee-8060187&Exemplar=1&LAN=DE A1 Tan, Hao A1 Zhu, Jie A1 Zhao, Yu Zhe A1 He, Ran A1 Ma, Yin Zhe A1 Liu, Bing Hai A1 Chen, Chang Qing A1 Tan, Pik Kee A1 Lam, Jeffrey A1 Mai, Zhi Hong YR 2017 SN 1946-1550 K1 Silicon K1 Scanning electron microscopy K1 Convolution K1 Deconvolution K1 Nonvolatile memory K1 Probes SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/IPFA.2017.8060187 DO https://doi.org/10.1109/IPFA.2017.8060187 SF ELIB - SuUB Bremen
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