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Advances in the understanding of microscopic switching mech..:
, In:
2017 47th European Solid-State Device Research Conference (ESSDERC)
,
Sklenard, Benoit
;
Blaise, Philippe
;
Traore, Boubacar
... - p. 46-49 , 2017
Link:
https://doi.org/10.1109/ESSDERC.2017.8066588
RT T1
2017 47th European Solid-State Device Research Conference (ESSDERC)
: T1
Advances in the understanding of microscopic switching mechanisms in ReRAM devices (Invited paper)
UL https://suche.suub.uni-bremen.de/peid=ieee-8066588&Exemplar=1&LAN=DE A1 Sklenard, Benoit A1 Blaise, Philippe A1 Traore, Boubacar A1 Dragoni, Alberto A1 Nail, Cecile A1 Vianello, Elisa YR 2017 SN 2378-6558 K1 Hafnium compounds K1 Electrodes K1 Dielectrics K1 Energy barrier K1 Random access memory K1 Atomic layer deposition SP 46 OP 49 LK http://dx.doi.org/https://doi.org/10.1109/ESSDERC.2017.8066588 DO https://doi.org/10.1109/ESSDERC.2017.8066588 SF ELIB - SuUB Bremen
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