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1 Ergebnisse
1
Negative bias temperature instability characterization and ..:
, In:
2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE)
,
Wan Muhamad Hatta, S.F.
;
Hussin, H.
;
Soon, F.Y.
... - p. 206-211 , 2017
Link:
https://doi.org/10.1109/ISCAIE.2017.8074978
RT T1 <cTitle>2017 IEEE Symposium on Computer Applications & Industrial Electronics (ISCAIE)</cTitle>: T1 <Title>Negative bias temperature instability characterization and lifetime evaluations of submicron pMOSFET</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8074978&Exemplar=1&LAN=DE A1 Wan Muhamad Hatta, S.F. A1 Hussin, H. A1 Soon, F.Y. A1 Wahab, Y. Abdul A1 Hadi, D. Abdul A1 Soin, N. A1 Zahirul Alam, A.H.M. A1 Nordin, A.N. YR 2017 K1 Degradation K1 Stress K1 Negative bias temperature instability K1 Thermal variables control K1 Delays K1 Temperature measurement K1 Transistors K1 negative bias temperature instability (NBTI) K1 pMOSFET K1 semiconductor reliability estimation K1 threshold voltage instability K1 interface states SP 206 OP 211 LK http://dx.doi.org/https://doi.org/10.1109/ISCAIE.2017.8074978 DO https://doi.org/10.1109/ISCAIE.2017.8074978 SF ELIB - SuUB Bremen
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