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1 Ergebnisse
1
Measurement technique for high precision and noise sensitiv..:
, In:
2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)
,
Chang, Yin-Cheng
;
Ou, Ya-Wen
;
Hsieh, Chao-Ping
... - p. 61-64 , 2017
Link:
https://doi.org/10.1109/ISEMC.2017.8077992
RT T1 <cTitle>2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI)</cTitle>: T1 <Title>Measurement technique for high precision and noise sensitive ICs using multiple output-bias board with low baseband Noise</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8077992&Exemplar=1&LAN=DE A1 Chang, Yin-Cheng A1 Ou, Ya-Wen A1 Hsieh, Chao-Ping A1 Chang, Da-Chiang A1 Wang, Ping-Yi A1 Hsu, Shawn S. H. A1 Yen, Mao-Hsu A1 Chang, Yen-Tang A1 Chen, Chang-Chiu YR 2017 SN 2158-1118 K1 Noise measurement K1 Baseband K1 Voltage-controlled oscillators K1 Phase noise K1 Voltage measurement K1 Power measurement K1 Voltage control K1 DC bias K1 power supply K1 baseband noise K1 voltage control oscillator (VCO) K1 phase noise SP 61 OP 64 LK http://dx.doi.org/https://doi.org/10.1109/ISEMC.2017.8077992 DO https://doi.org/10.1109/ISEMC.2017.8077992 SF ELIB - SuUB Bremen
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