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Stress analysis in matrices of stand-alone nanowires depend..:
, In:
2017 8th Annual Industrial Automation and Electromechanical Engineering Conference (IEMECON)
,
Banerjee, Pratim
;
Ray, Sreyan
;
Chatterjee, Soumya
... - p. 385-386 , 2017
Link:
https://doi.org/10.1109/IEMECON.2017.8079627
RT T1 <cTitle>2017 8th Annual Industrial Automation and Electromechanical Engineering Conference (IEMECON)</cTitle>: T1 <Title>Stress analysis in matrices of stand-alone nanowires depending on matrix spacing</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8079627&Exemplar=1&LAN=DE A1 Banerjee, Pratim A1 Ray, Sreyan A1 Chatterjee, Soumya A1 Bakshi, Prattay A1 Kar, Soumik A1 Dey, Sovon Kr. A1 Banerjee, Soumik A1 Shekhar, Shashank YR 2017 K1 Nanowires K1 Stress K1 Substrates K1 Indium phosphide K1 Zinc oxide K1 Silicon K1 III-V semiconductor materials K1 nanowires K1 Si substrate K1 process-induced K1 InP K1 ZnO K1 TiO2 K1 lattice-mismatch K1 thermal-mismatch SP 385 OP 386 LK http://dx.doi.org/https://doi.org/10.1109/IEMECON.2017.8079627 DO https://doi.org/10.1109/IEMECON.2017.8079627 SF ELIB - SuUB Bremen
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