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Topology and discontinuities effect on CMOS rotary travelin..:

, In: 2017 14th International Conference on Electrical Engineering, Computing Science and Automatic Control (CCE),
Higuera Gonzalez, Rogelio M. ; Aranda, Monico Linares ; Martinez, Luis Hernandez. - p. 1-5 , 2017
Link: https://doi.org/10.1109/ICEEE.2017.8108855