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1 Ergebnisse
1
Very large scale phase measuring interferometry for profile..:
, In:
Technical Digest. CLEO/Pacific Rim '99. Pacific Rim Conference on Lasers and Electro-Optics (Cat. No.99TH8464)
,
Seung-Woo Kim
;
In-Chul Chang
;
Dong-Sik Kim
.. - p. 70,71 , 1999
Link:
https://doi.org/10.1109/CLEOPR.1999.811628
RT T1 <cTitle>Technical Digest. CLEO/Pacific Rim '99. Pacific Rim Conference on Lasers and Electro-Optics (Cat. No.99TH8464)</cTitle>: T1 <Title>Very large scale phase measuring interferometry for profile measurement of aspheric surfaces with nanometer accuracy</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-811628&Exemplar=1&LAN=DE A1 Seung-Woo Kim A1 In-Chul Chang A1 Dong-Sik Kim A1 Tae-Ho Kim A1 Seung-Bong Yoo YR 1999 K1 Large-scale systems K1 Phase measurement K1 Optical interferometry K1 Probes K1 Interference K1 Microscopy K1 Charge coupled devices K1 Charge-coupled image sensors K1 Optical control K1 Mirrors SP 70,71 LK http://dx.doi.org/https://doi.org/10.1109/CLEOPR.1999.811628 DO https://doi.org/10.1109/CLEOPR.1999.811628 SF ELIB - SuUB Bremen
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