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1 Ergebnisse
1
Thermal effects on the I-V characteristics of filamentary V..:
, In:
2017 17th Non-Volatile Memory Technology Symposium (NVMTS)
,
von Witzleben, M.
;
Wichmann, E.
;
Funck, C.
... - p. 1-5 , 2017
Link:
https://doi.org/10.1109/NVMTS.2017.8171313
RT T1
2017 17th Non-Volatile Memory Technology Symposium (NVMTS)
: T1
Thermal effects on the I-V characteristics of filamentary VCM based ReRAM-cells using a nanometer-sized heater
UL https://suche.suub.uni-bremen.de/peid=ieee-8171313&Exemplar=1&LAN=DE A1 von Witzleben, M. A1 Wichmann, E. A1 Funck, C. A1 Fleck, K. A1 Waser, R. A1 Bottger, U. A1 Breuer, T. A1 Menzel, S. YR 2017 K1 Heating systems K1 Resistance K1 Electrodes K1 Temperature measurement K1 Voltage measurement K1 Temperature K1 Switches K1 heater K1 temperature measurement K1 ReRAM K1 TaOx K1 VCM SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/NVMTS.2017.8171313 DO https://doi.org/10.1109/NVMTS.2017.8171313 SF ELIB - SuUB Bremen
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