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Texture characteristic based fast algorithm for CU size dec..:

, In: 2017 7th International Conference on Integrated Circuits, Design, and Verification (ICDV),
Le Dinh Trang, Dang ; Kim, Kyung Rae ; Chang, Ik Joon. - p. 88-93 , 2017
Link: https://doi.org/10.1109/ICDV.2017.8188645