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Monte Carlo-based tolerance study of an end-fed resonant sl..:

, In: 2017 CHILEAN Conference on Electrical, Electronics Engineering, Information and Communication Technologies (CHILECON),
Ripoll-Solano, Lacides ; Torres-Herrera, Luis ; Sierra-Perez, Manuel - p. 1-6 , 2017
Link: https://doi.org/10.1109/CHILECON.2017.8229586