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On-line software-based self-test for ECC of embedded RAM me..:

, In: 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Restifo, M. ; Bernardi, P. ; De Luca, S.. - p. 1-6 , 2017
Link: https://doi.org/10.1109/DFT.2017.8244443