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On-line software-based self-test for ECC of embedded RAM me..:
, In:
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
,
Restifo, M.
;
Bernardi, P.
;
De Luca, S.
. - p. 1-6 , 2017
Link:
https://doi.org/10.1109/DFT.2017.8244443
RT T1
2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
: T1
On-line software-based self-test for ECC of embedded RAM memories
UL https://suche.suub.uni-bremen.de/peid=ieee-8244443&Exemplar=1&LAN=DE A1 Restifo, M. A1 Bernardi, P. A1 De Luca, S. A1 Sansonetti, A. YR 2017 SN 2377-7966 K1 Error correction codes K1 Random access memory K1 Decoding K1 Built-in self-test K1 Transient analysis K1 Taxonomy K1 Registers K1 ECC logic K1 Software-Based Self-Test K1 latent faults SP 1 OP 6 LK http://dx.doi.org/https://doi.org/10.1109/DFT.2017.8244443 DO https://doi.org/10.1109/DFT.2017.8244443 SF ELIB - SuUB Bremen
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