I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Measurement of plasma parameters by electric probes in a si..:

, In: IEEE Conference Record - Abstracts. 1999 IEEE International Conference on Plasma Science. 26th IEEE International Conference (Cat. No.99CH36297),
Chung, K.-S. ; Choi, Y.-S. ; Chang, D.-H.... - p. 244 , 1999
Link: https://doi.org/10.1109/PLASMA.1999.829567