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SPICE model for the ramp rate effect in the reset character..:
, In:
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
,
Rodriguez-Fernandez, Alberto
;
Sune, Jordi
;
Miranda, Enrique
... - p. 1-4 , 2017
Link:
https://doi.org/10.1109/DCIS.2017.8311635
RT T1
2017 32nd Conference on Design of Circuits and Integrated Systems (DCIS)
: T1
SPICE model for the ramp rate effect in the reset characteristic of memristive devices
UL https://suche.suub.uni-bremen.de/peid=ieee-8311635&Exemplar=1&LAN=DE A1 Rodriguez-Fernandez, Alberto A1 Sune, Jordi A1 Miranda, Enrique A1 Gonzalez, Mireia Bargallo A1 Campabadal, Francesca A1 Al Chawa, Mohamad Moner A1 Picos, Rodrigo YR 2017 K1 Switches K1 SPICE K1 Memristors K1 Resistance K1 Computational modeling K1 Semiconductor device measurement K1 Random access memory K1 memristor K1 ramp rate K1 Resistive Random Access Memory (RRAM) SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/DCIS.2017.8311635 DO https://doi.org/10.1109/DCIS.2017.8311635 SF ELIB - SuUB Bremen
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