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Polysilicon resistor stability under voltage stress for saf..:

, In: 2018 IEEE International Reliability Physics Symposium (IRPS),
Kendrick, C. ; Cook, M. ; Gambino, J.P.... - p. P-RT.4-1-P-RT.4-5 , 2018
Link: https://doi.org/10.1109/IRPS.2018.8353686