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1 Ergebnisse
1
Polysilicon resistor stability under voltage stress for saf..:
, In:
2018 IEEE International Reliability Physics Symposium (IRPS)
,
Kendrick, C.
;
Cook, M.
;
Gambino, J.P.
... - p. P-RT.4-1-P-RT.4-5 , 2018
Link:
https://doi.org/10.1109/IRPS.2018.8353686
RT T1
2018 IEEE International Reliability Physics Symposium (IRPS)
: T1
Polysilicon resistor stability under voltage stress for safe-operating area characterization
UL https://suche.suub.uni-bremen.de/peid=ieee-8353686&Exemplar=1&LAN=DE A1 Kendrick, C. A1 Cook, M. A1 Gambino, J.P. A1 Myers, T. A1 Slezak, J. A1 Hirano, T. A1 Sano, T. A1 Watanabe, Y. A1 Ozeki, K. YR 2018 SN 1938-1891 K1 Resistors K1 Resistance K1 Stress K1 Temperature measurement K1 Electrical resistance measurement K1 Reliability K1 Current density K1 polysilicon resistor K1 resistance stability K1 safe-operating area SP P OP RT.4-1-P-RT.4-5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS.2018.8353686 DO https://doi.org/10.1109/IRPS.2018.8353686 SF ELIB - SuUB Bremen
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