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Operando X-Ray Diffraction for Characterization of Photovol..:
, In:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
,
Schelhas, Laura T.
;
Christians, Jeffrey A.
;
Berry, Joseph J.
... - p. 2176-2178 , 2017
Link:
https://doi.org/10.1109/PVSC.2017.8366099
RT T1
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
: T1
Operando X-Ray Diffraction for Characterization of Photovoltaic Materials
UL https://suche.suub.uni-bremen.de/peid=ieee-8366099&Exemplar=1&LAN=DE A1 Schelhas, Laura T. A1 Christians, Jeffrey A. A1 Berry, Joseph J. A1 Toney, Michael F. A1 Tassone, Christopher J. A1 Luther, Joseph M. A1 Stone, Kevin H. YR 2017 K1 Photovoltaic cells K1 X-ray scattering K1 Heating systems K1 Photovoltaic systems K1 Data collection K1 Performance evaluation K1 LID K1 minority carrier lifetime K1 Cz silicon K1 IR belt furnace K1 high temperature LID recovery SP 2176 OP 2178 LK http://dx.doi.org/https://doi.org/10.1109/PVSC.2017.8366099 DO https://doi.org/10.1109/PVSC.2017.8366099 SF ELIB - SuUB Bremen
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