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1 Ergebnisse
1
Decoupling grain-boundary, grain-interior, and surface reco..:
, In:
2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)
,
Moseley, John
;
Rale, Pierre
;
Collin, Stephane
... - p. 3147-3149 , 2017
Link:
https://doi.org/10.1109/PVSC.2017.8366445
RT T1 <cTitle>2017 IEEE 44th Photovoltaic Specialist Conference (PVSC)</cTitle>: T1 <Title>Decoupling grain-boundary, grain-interior, and surface recombination with cathodoluminescence</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8366445&Exemplar=1&LAN=DE A1 Moseley, John A1 Rale, Pierre A1 Collin, Stephane A1 Kanevce, Ana A1 Colegrove, Eric A1 Duenow, Joel A1 Jensen, Soren A1 Metzger, Wyatt K. A1 Al-Jassim, Mowafak M. YR 2017 K1 Grain size K1 II-VI semiconductor materials K1 Cadmium compounds K1 Surface treatment K1 Numerical simulation K1 Standards K1 Photoluminescence K1 semiconductor device measurement K1 photoluminescence K1 semiconductor epitaxial layers SP 3147 OP 3149 LK http://dx.doi.org/https://doi.org/10.1109/PVSC.2017.8366445 DO https://doi.org/10.1109/PVSC.2017.8366445 SF ELIB - SuUB Bremen
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