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A statistical equivalent circuit modelling based on measure..:
, In:
2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC)
,
Yang, De-Cao
;
Yao, Shi
;
Gao, Liang
... - p. 151-151 , 2018
Link:
https://doi.org/10.1109/ISEMC.2018.8394098
RT T1 <cTitle>2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC)</cTitle>: T1 <Title>A statistical equivalent circuit modelling based on measured and de-embedded S-parameters</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8394098&Exemplar=1&LAN=DE A1 Yang, De-Cao A1 Yao, Shi A1 Gao, Liang A1 Zhou, Jing A1 Xia, Nan A1 Gu, Zheng-Dong A1 Wei, Xing-Chang YR 2018 K1 Integrated circuit modeling K1 Capacitors K1 Equivalent circuits K1 Scattering parameters K1 Frequency measurement K1 Semiconductor device measurement K1 Analytical models SP 151 OP 151 LK http://dx.doi.org/https://doi.org/10.1109/ISEMC.2018.8394098 DO https://doi.org/10.1109/ISEMC.2018.8394098 SF ELIB - SuUB Bremen
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