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Co-deposition of Nano-Size SiC Particles in Micro-Via:
, In:
2018 IEEE 68th Electronic Components and Technology Conference (ECTC)
,
Wu, Houya
;
He, Hu
;
Wang, Yan
... - p. 1170-1175 , 2018
Link:
https://doi.org/10.1109/ECTC.2018.00180
RT T1
2018 IEEE 68th Electronic Components and Technology Conference (ECTC)
: T1
Co-deposition of Nano-Size SiC Particles in Micro-Via
UL https://suche.suub.uni-bremen.de/peid=ieee-8429693&Exemplar=1&LAN=DE A1 Wu, Houya A1 He, Hu A1 Wang, Yan A1 Wang, Liancheng A1 Wang, Fuliang A1 Zhu, Wenhui A1 Chen, Zhuo YR 2018 SN 2377-5726 K1 Silicon carbide K1 Current density K1 Filling K1 Electric potential K1 Manufacturing K1 Electrical engineering K1 Silicon K1 co deposition K1 interconnect structure K1 nanoparticle K1 electrochemical deposition SP 1170 OP 1175 LK http://dx.doi.org/https://doi.org/10.1109/ECTC.2018.00180 DO https://doi.org/10.1109/ECTC.2018.00180 SF ELIB - SuUB Bremen
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