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Analog Fault Identification in RF Circuits using Artificial..:
, In:
2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)
,
Viveros-Wacher, Andres
;
Rayas-Sanchez, JoseE.
- p. 1-3 , 2018
Link:
https://doi.org/10.1109/NEMO.2018.8503117
RT T1 <cTitle>2018 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO)</cTitle>: T1 <Title>Analog Fault Identification in RF Circuits using Artificial Neural Networks and Constrained Parameter Extraction</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8503117&Exemplar=1&LAN=DE A1 Viveros-Wacher, Andres A1 Rayas-Sanchez, JoseE. YR 2018 K1 Circuit faults K1 Fault diagnosis K1 Artificial neural networks K1 Integrated circuit modeling K1 Optimization K1 Radio frequency K1 analog faults K1 artificial neural network K1 gross faults K1 fault injection K1 fault identification K1 parameter extraction SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/NEMO.2018.8503117 DO https://doi.org/10.1109/NEMO.2018.8503117 SF ELIB - SuUB Bremen
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