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1 Ergebnisse
1
Long-Term Tum-by-Tum Measurements of Electron bunch Profile..:
, In:
2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
,
Funkner, Stefan
;
Muller, Anke-Susanne
;
Brosi, Miriam
... - p. 1-2 , 2018
Link:
https://doi.org/10.1109/IRMMW-THz.2018.8510080
RT T1 <cTitle>2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)</cTitle>: T1 <Title>Long-Term Tum-by-Tum Measurements of Electron bunch Profiles at MHz Repetition Rates in a Storage Ring with Single-Shot Electro-Optical Sampling</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8510080&Exemplar=1&LAN=DE A1 Funkner, Stefan A1 Muller, Anke-Susanne A1 Brosi, Miriam A1 Brundermann, Erik A1 Caselle, Michele A1 Nasse, Michael J. A1 Niehues, Gudrun A1 Rota, Lorenzo A1 Schonfeldt, Patrik A1 Weber, Marc YR 2018 SN 2162-2035 K1 Storage rings K1 Electrooptical waveguides K1 Arrays K1 Density measurement K1 Charge measurement K1 Monitoring K1 Detectors SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/IRMMW-THz.2018.8510080 DO https://doi.org/10.1109/IRMMW-THz.2018.8510080 SF ELIB - SuUB Bremen
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