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1 Ergebnisse
1
True 7nm Platform Technology featuring Smallest FinFET and ..:
, In:
2018 IEEE Symposium on VLSI Technology
,
Jeong, W.C.
;
Kwon, D.J.
;
Nam, K.J.
... - p. 59-60 , 2018
Link:
https://doi.org/10.1109/VLSIT.2018.8510682
RT T1
2018 IEEE Symposium on VLSI Technology
: T1
True 7nm Platform Technology featuring Smallest FinFET and Smallest SRAM cell by EUV, Special Constructs and 3rd Generation Single Diffusion Break
UL https://suche.suub.uni-bremen.de/peid=ieee-8510682&Exemplar=1&LAN=DE A1 Jeong, W.C. A1 Kwon, D.J. A1 Nam, K.J. A1 Rim, W.J. A1 Jang, M.S. A1 Kim, H.T. A1 Lee, Y.W. A1 Park, J.S. A1 Lee, E.C. A1 Ha, D.W. A1 Park, C.H. A1 Maeda, S. A1 Cho, H.-J. A1 Jung, S.-M. A1 Kang, H.K. A1 Lee, H.J. A1 Lee, K.W. A1 Lee, T.J. A1 Park, D.W. A1 Kim, B.S. A1 Do, J.H. A1 Fukai, T. YR 2018 SN 2158-9682 K1 SRAM cells K1 Layout K1 FinFETs K1 Very large scale integration K1 3G mobile communication K1 Logic testing SP 59 OP 60 LK http://dx.doi.org/https://doi.org/10.1109/VLSIT.2018.8510682 DO https://doi.org/10.1109/VLSIT.2018.8510682 SF ELIB - SuUB Bremen
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