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1 Ergebnisse
1
Investigation of Carbon Interstitials in the Vicinity of th..:
, In:
2018 International Semiconductor Conference (CAS)
,
Alsnani, Hind
;
Goss, J.P.
;
Al-Ani, Oras
... - p. 231-234 , 2018
Link:
https://doi.org/10.1109/SMICND.2018.8539842
RT T1 <cTitle>2018 International Semiconductor Conference (CAS)</cTitle>: T1 <Title>Investigation of Carbon Interstitials in the Vicinity of the Si02/4H-SiC(0001) Interface</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8539842&Exemplar=1&LAN=DE A1 Alsnani, Hind A1 Goss, J.P. A1 Al-Ani, Oras A1 Olsen, S.H. A1 Briddon, P.R. A1 Rayson, M.J. A1 Horsfall, A.B. YR 2018 K1 Carbon K1 Silicon carbide K1 Charge carrier lifetime K1 Slabs K1 Oxidation K1 Density functional theory K1 Performance evaluation K1 SiO2/4H-SiC K1 Density Functional Theory K1 Carbon-Interstitial K1 Diffusion SP 231 OP 234 LK http://dx.doi.org/https://doi.org/10.1109/SMICND.2018.8539842 DO https://doi.org/10.1109/SMICND.2018.8539842 SF ELIB - SuUB Bremen
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