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Analysis of Gate-Noise in Hard Switching and Soft Switching..:
, In:
2018 21st International Conference on Electrical Machines and Systems (ICEMS)
,
Kim, Sung-Jae
;
Kim, Hyun-Bin
;
Jung, Jae-Woong
. - p. 764-768 , 2018
Link:
https://doi.org/10.23919/ICEMS.2018.8549383
RT T1 <cTitle>2018 21st International Conference on Electrical Machines and Systems (ICEMS)</cTitle>: T1 <Title>Analysis of Gate-Noise in Hard Switching and Soft Switching for Half-Bridge Structure Using GaN HEMT</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8549383&Exemplar=1&LAN=DE A1 Kim, Sung-Jae A1 Kim, Hyun-Bin A1 Jung, Jae-Woong A1 Kim, Jong-Soo YR 2018 K1 Logic gates K1 Switches K1 Gallium nitride K1 HEMTs K1 Soft switching K1 Voltage measurement K1 Resistance K1 GaN HEMT K1 gate noise K1 parasitic components K1 synchronous buck converter K1 hard switching K1 soft switching SP 764 OP 768 LK http://dx.doi.org/https://doi.org/10.23919/ICEMS.2018.8549383 DO https://doi.org/10.23919/ICEMS.2018.8549383 SF ELIB - SuUB Bremen
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