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A Carrier Lifetime Sensitivity Probe Based on Transient Cap..:

, In: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Adamu-Lema, F. ; Duan, M. ; Georgiev, V.. - p. 232-235 , 2018
Link: https://doi.org/10.1109/SISPAD.2018.8551644