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1 Ergebnisse
1
Single event latchup in ICs with integrated latchup protect..:
, In:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
,
Kostyuchenko, D.S.
;
Karakozov, A.B
;
Nekrasov, P.V.
... - p. 1-3 , 2017
Link:
https://doi.org/10.1109/RADECS.2017.8696207
RT T1
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)
: T1
Single event latchup in ICs with integrated latchup protection technology
UL https://suche.suub.uni-bremen.de/peid=ieee-8696207&Exemplar=1&LAN=DE A1 Kostyuchenko, D.S. A1 Karakozov, A.B A1 Nekrasov, P.V. A1 Pechenkin, A.A. A1 Savchenkov, D. V. A1 Nikiforov, A. Yu. YR 2017 SN 1609-0438 K1 Ions K1 Testing K1 Power supplies K1 Laser modes K1 Single event latchup K1 7809ALP K1 ADC K1 SEL K1 Latchup Protected K1 Laser Experiment SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/RADECS.2017.8696207 DO https://doi.org/10.1109/RADECS.2017.8696207 SF ELIB - SuUB Bremen
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