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On the Effect of NBTI Induced Aging of Power Stage on the T..:
, In:
2019 IEEE International Reliability Physics Symposium (IRPS)
,
Krishna Chekuri, Venkata Chaitanya
;
Singh, Arvind
;
Dasari, Nihar
. - p. 1-5 , 2019
Link:
https://doi.org/10.1109/IRPS.2019.8720451
RT T1
2019 IEEE International Reliability Physics Symposium (IRPS)
: T1
On the Effect of NBTI Induced Aging of Power Stage on the Transient Performance of On-Chip Voltage Regulators
UL https://suche.suub.uni-bremen.de/peid=ieee-8720451&Exemplar=1&LAN=DE A1 Krishna Chekuri, Venkata Chaitanya A1 Singh, Arvind A1 Dasari, Nihar A1 Mukhopadhyay, Saibal YR 2019 SN 1938-1891 K1 Stress K1 Negative bias temperature instability K1 Thermal variables control K1 Transfer functions K1 Transient analysis K1 Degradation K1 Predictive models K1 NBTI K1 IVR K1 DLDO K1 Aging K1 Voltage stress SP 1 OP 5 LK http://dx.doi.org/https://doi.org/10.1109/IRPS.2019.8720451 DO https://doi.org/10.1109/IRPS.2019.8720451 SF ELIB - SuUB Bremen
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