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1 Ergebnisse
1
Reliability-Aware FinFET Design:
, In:
2019 Electron Devices Technology and Manufacturing Conference (EDTM)
,
Toledano-Luque, M.
;
Zhu, B.
;
Min, B.
... - p. 218-221 , 2019
Link:
https://doi.org/10.1109/EDTM.2019.8731235
RT T1
2019 Electron Devices Technology and Manufacturing Conference (EDTM)
: T1
Reliability-Aware FinFET Design
UL https://suche.suub.uni-bremen.de/peid=ieee-8731235&Exemplar=1&LAN=DE A1 Toledano-Luque, M. A1 Zhu, B. A1 Min, B. A1 Nigam, T. A1 Srinivasan, P. A1 Paliwoda, P. A1 Cimino, S. A1 Chbili, Z. A1 Mahmud, M. Iqbal A1 Gupta, A. A1 Shen, T. A1 Kauerauf, T. YR 2019 K1 FinFETs K1 Logic gates K1 Degradation K1 Annealing K1 Reliability engineering K1 Human computer interaction K1 reliability K1 BTI K1 HCI K1 TDDB K1 CMOS SP 218 OP 221 LK http://dx.doi.org/https://doi.org/10.1109/EDTM.2019.8731235 DO https://doi.org/10.1109/EDTM.2019.8731235 SF ELIB - SuUB Bremen
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