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1 Ergebnisse
1
Four-Wave Mixing Microscopy of Resonant Silicon-on-Insulato..:
, In:
2019 Conference on Lasers and Electro-Optics (CLEO)
,
Biswas, Rabindra
;
Deka, Jayanta
;
Jha, Keshav Kumar
... - p. 1-2 , 2019
Link:
https://doi.org/10.1364/CLEO_AT.2019.JW2A.37
RT T1
2019 Conference on Lasers and Electro-Optics (CLEO)
: T1
Four-Wave Mixing Microscopy of Resonant Silicon-on-Insulator Two-Dimensional Zero Contrast Gratings
UL https://suche.suub.uni-bremen.de/peid=ieee-8749535&Exemplar=1&LAN=DE A1 Biswas, Rabindra A1 Deka, Jayanta A1 Jha, Keshav Kumar A1 Vishnu Praveen, A A1 Lal Krishna, A.S A1 Raghunathan, Varun YR 2019 K1 Four-wave mixing K1 Microscopy K1 Gratings K1 Diffraction K1 Optical microscopy K1 Silicon K1 Apertures SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1364/CLEO_AT.2019.JW2A.37 DO https://doi.org/10.1364/CLEO_AT.2019.JW2A.37 SF ELIB - SuUB Bremen
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