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1 Ergebnisse
1
OCT for non-destructive examination of the internal biologi..:
, In:
2018 5th International Conference on Electrical Engineering, Computer Science and Informatics (EECSI)
,
Ravichandran, Naresh Kumar
;
Jeon, Deokmin
;
Lee, Junsoo
... - p. 436-439 , 2018
Link:
https://doi.org/10.1109/EECSI.2018.8752659
RT T1 <cTitle>2018 5th International Conference on Electrical Engineering, Computer Science and Informatics (EECSI)</cTitle>: T1 <Title>OCT for non-destructive examination of the internal biological structures of mosquito specimen</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8752659&Exemplar=1&LAN=DE A1 Ravichandran, Naresh Kumar A1 Jeon, Deokmin A1 Lee, Junsoo A1 Park, Jaeseok A1 Yun, Byoung-Ju A1 Lee, Sangbong A1 Kim, Pilun A1 Choi, Kwang Shik A1 Jung, Hee-Young A1 Jeon, Byeonggyu A1 Jeon, Mansik A1 Kim, Jeehyun YR 2018 K1 Diseases K1 Optical coherence tomography K1 Optical sensors K1 Biomedical optical imaging K1 Optical imaging K1 Head K1 optical coherence tomography K1 Anopheles sinensis K1 non-destructive imaging K1 internal morphological analysis SP 436 OP 439 LK http://dx.doi.org/https://doi.org/10.1109/EECSI.2018.8752659 DO https://doi.org/10.1109/EECSI.2018.8752659 SF ELIB - SuUB Bremen
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