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1 Ergebnisse
1
Silicon Nitride Stress Liner Impacts on the Electrical Char..:
, In:
2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
,
Cheng, Wei-Chih
;
Fang, Tao
;
Lei, Siqi
... - p. 1-3 , 2019
Link:
https://doi.org/10.1109/EDSSC.2019.8754212
RT T1
2019 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC)
: T1
Silicon Nitride Stress Liner Impacts on the Electrical Characteristics of AlGaN/GaN HEMTs
UL https://suche.suub.uni-bremen.de/peid=ieee-8754212&Exemplar=1&LAN=DE A1 Cheng, Wei-Chih A1 Fang, Tao A1 Lei, Siqi A1 Zhao, Yunlong A1 He, Minghao A1 Chan, Mansun A1 Xia, Guangrui A1 Zhao, Feng A1 Yu, Hongyu YR 2019 K1 HEMTs K1 Aluminum gallium nitride K1 Wide band gap semiconductors K1 MODFETs K1 Logic gates K1 Strain K1 Stress K1 Gallium nitride (GaN) K1 High electron mobility transistor (HEMT) K1 Strain engineering SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/EDSSC.2019.8754212 DO https://doi.org/10.1109/EDSSC.2019.8754212 SF ELIB - SuUB Bremen
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