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A High-reliability Half-Bridge GaN FET Gate Driver with Adv..:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Ming, Xin ; Zhang, Xuan ; Zhang, Zhi-Wen... - p. 127-130 , 2019
Link: https://doi.org/10.1109/ISPSD.2019.8757625