I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

New Circuit Topology for System-Level Reliability of GaN:

, In: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD),
Lin, Ming-Cheng ; Chang, Wen-Che ; Wu, Haw-Yun... - p. 299-302 , 2019
Link: https://doi.org/10.1109/ISPSD.2019.8757683