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1 Ergebnisse
1
Non-Volatile RRAM Embedded into 22FFL FinFET Technology:
, In:
2019 Symposium on VLSI Technology
,
Golonzka, O.
;
Arslan, U.
;
Bai, P.
... - p. T230-T231 , 2019
Link:
https://doi.org/10.23919/VLSIT.2019.8776570
RT T1
2019 Symposium on VLSI Technology
: T1
Non-Volatile RRAM Embedded into 22FFL FinFET Technology
UL https://suche.suub.uni-bremen.de/peid=ieee-8776570&Exemplar=1&LAN=DE A1 Golonzka, O. A1 Arslan, U. A1 Bai, P. A1 Bohr, M. A1 Baykan, O. A1 Chang, Y. A1 Chaudhari, A. A1 Chen, A. A1 Clarke, J. A1 Connor, C. A1 Das, N. A1 English, C. A1 Ghani, T. A1 Hamzaoglu, F. A1 Hentges, P. A1 Jain, P. A1 Jezewski, C. A1 Karpov, I. A1 Kothari, H. A1 Kotlyar, R. A1 Lin, B. A1 Metz, M. A1 Odonnell, J. A1 Ouellette, D. A1 Park, J. A1 Pirkle, A. A1 Quintero, P. A1 Seghete, D. A1 Sekhar, M. A1 Gupta, A. Sen A1 Seth, M. A1 Strutt, N. A1 Wiegand, C. A1 Yoo, H. J. A1 Fischer, K. YR 2019 SN 2158-9682 K1 Arrays K1 Switches K1 Resistance K1 Bit error rate K1 FinFETs K1 Nonvolatile memory K1 Degradation SP T230 OP T231 LK http://dx.doi.org/https://doi.org/10.23919/VLSIT.2019.8776570 DO https://doi.org/10.23919/VLSIT.2019.8776570 SF ELIB - SuUB Bremen
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