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1 Ergebnisse
1
Optimal MC/DC Test Case Generation:
, In:
2019 IEEE/ACM 41st International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)
,
Jaffar, Joxan
;
Godboley, Sangharatna
;
Maghareh, Rasool
- p. 288-289 , 2019
Link:
https://doi.org/10.1109/ICSE-Companion.2019.00118
RT T1 <cTitle>2019 IEEE/ACM 41st International Conference on Software Engineering: Companion Proceedings (ICSE-Companion)</cTitle>: T1 <Title>Optimal MC/DC Test Case Generation</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8802829&Exemplar=1&LAN=DE A1 Jaffar, Joxan A1 Godboley, Sangharatna A1 Maghareh, Rasool YR 2019 SN 2574-1934 K1 Interpolation K1 Benchmark testing K1 Annotations K1 Software K1 Task analysis K1 Computer bugs K1 Software Testing K1 Code Coverage K1 MC/DC K1 Symbolic Execution SP 288 OP 289 LK http://dx.doi.org/https://doi.org/10.1109/ICSE-Companion.2019.00118 DO https://doi.org/10.1109/ICSE-Companion.2019.00118 SF ELIB - SuUB Bremen
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