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1
Reliability Considerations for the Qualification of Leading..:
, In:
2019 19th International Workshop on Junction Technology (IWJT)
,
Guarin, F.
- p. 1-3 , 2019
Link:
https://doi.org/10.23919/IWJT.2019.8802904
RT T1 <cTitle>2019 19th International Workshop on Junction Technology (IWJT)</cTitle>: T1 <Title>Reliability Considerations for the Qualification of Leading Edge CMOS Technologies</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8802904&Exemplar=1&LAN=DE A1 Guarin, F. YR 2019 K1 Radio frequency K1 Integrated circuit reliability K1 Stress K1 Qualifications K1 Degradation K1 Silicon K1 ring oscillator K1 CMOS Reliability K1 RF Reliability K1 BTI K1 HCI K1 TDDB K1 self-heating SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.23919/IWJT.2019.8802904 DO https://doi.org/10.23919/IWJT.2019.8802904 SF ELIB - SuUB Bremen
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