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1 Ergebnisse
1
Free-Space Permittivity Measurement for Inhomogeneous PSV-C..:
, In:
2019 IEEE MTT-S International Wireless Symposium (IWS)
,
Jung, Sohyeon
;
Choo, Moogoong
;
Lee, Jae-Yeong
... - p. 1-3 , 2019
Link:
https://doi.org/10.1109/IEEE-IWS.2019.8804020
RT T1
2019 IEEE MTT-S International Wireless Symposium (IWS)
: T1
Free-Space Permittivity Measurement for Inhomogeneous PSV-Coated Si-wafer at Frequencies from 75 GHz to 325 GHz
UL https://suche.suub.uni-bremen.de/peid=ieee-8804020&Exemplar=1&LAN=DE A1 Jung, Sohyeon A1 Choo, Moogoong A1 Lee, Jae-Yeong A1 Ahn, In-sung A1 Lee, Kangseop A1 Hong, Wonbin YR 2019 K1 Permittivity K1 Permittivity measurement K1 Dielectrics K1 Scattering parameters K1 Nonhomogeneous media K1 Frequency measurement K1 complex permittivity K1 free-space transmission measurement K1 fabry-Perot effect K1 inhomogeneous material K1 iterative algorithm K1 passivation material SP 1 OP 3 LK http://dx.doi.org/https://doi.org/10.1109/IEEE-IWS.2019.8804020 DO https://doi.org/10.1109/IEEE-IWS.2019.8804020 SF ELIB - SuUB Bremen
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