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1 Ergebnisse
1
Analysis of Transient Effect on Super-Steep SS PN-Body Tied..:
, In:
2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
,
Mori, Takayuki
;
Ida, Jiro
;
Endo, Hiroki
- p. 1-2 , 2019
Link:
https://doi.org/10.1109/VLSI-TSA.2019.8804639
RT T1
2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
: T1
Analysis of Transient Effect on Super-Steep SS PN-Body Tied SOI-FET
UL https://suche.suub.uni-bremen.de/peid=ieee-8804639&Exemplar=1&LAN=DE A1 Mori, Takayuki A1 Ida, Jiro A1 Endo, Hiroki YR 2019 K1 Logic gates K1 Transient analysis K1 Delays K1 Charge carrier processes K1 Computational modeling K1 Switches K1 Spontaneous emission SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-TSA.2019.8804639 DO https://doi.org/10.1109/VLSI-TSA.2019.8804639 SF ELIB - SuUB Bremen
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