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Hot-Carrier Injection-Induced Disturb and Improvement Metho..:

, In: 2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA),
Lin, Wei-Liang ; Tsai, Wen-Jer ; Cheng, C.C.... - p. 1-2 , 2019
Link: https://doi.org/10.1109/VLSI-TSA.2019.8804652