I agree that this site is using cookies. You can find further informations
here
.
X
Login
Merkliste (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
zur Desktop-Version
Toggle navigation
Merkliste
1 Ergebnisse
1
Silicon Process Impact on 5G NR mmWave Front End Design and..:
, In:
2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
,
Cheng, Chuan-Cheng
;
Dunworth, Jeremy
;
Kalpat, Sriram
... - p. 1-2 , 2019
Link:
https://doi.org/10.1109/VLSI-TSA.2019.8804709
RT T1
2019 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA)
: T1
Silicon Process Impact on 5G NR mmWave Front End Design and Performance
UL https://suche.suub.uni-bremen.de/peid=ieee-8804709&Exemplar=1&LAN=DE A1 Cheng, Chuan-Cheng A1 Dunworth, Jeremy A1 Kalpat, Sriram A1 Cheng, Haitao A1 Liu, Gang A1 Yang, Ming-Ta A1 Sy, Wing A1 Wang, Joseph A1 Sahota, Kamal A1 Chidambaram, PR. Chidi YR 2019 K1 5G mobile communication K1 Switches K1 Radio frequency K1 Reliability engineering K1 Performance evaluation K1 Bandwidth SP 1 OP 2 LK http://dx.doi.org/https://doi.org/10.1109/VLSI-TSA.2019.8804709 DO https://doi.org/10.1109/VLSI-TSA.2019.8804709 SF ELIB - SuUB Bremen
Export
RefWorks (nur Desktop-Version!)
Flow
(Zuerst in
Flow
einloggen, dann importieren)