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The How and why of Biased Humidity Tests with Copper Wire:

, In: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC),
Mavinkurve, A. ; Rongen, R.T.H. ; Goumans, L.... - p. 777-784 , 2019
Link: https://doi.org/10.1109/ECTC.2019.00123