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Spatially Mapping Work Function Changes and Defect Evolutio..:

, In: 2019 IEEE 9th International Nanoelectronics Conferences (INEC),
Ong, Bin Leong ; Ong, Sheau Wei ; Liu, Bo... - p. 1-6 , 2019
Link: https://doi.org/10.1109/INEC.2019.8853850