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Detection of Spatial Outlier by Using Improved Z-Score Test:

, In: 2019 3rd International Conference on Trends in Electronics and Informatics (ICOEI),
Aggarwal, Vaibhav ; Gupta, Vaibhav ; Singh, Prayag.. - p. 788-790 , 2019
Link: https://doi.org/10.1109/ICOEI.2019.8862582