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1 Ergebnisse
1
Automatic Defect Detection System Based on Deep Convolution..:
, In:
2019 International Conference on Engineering, Science, and Industrial Applications (ICESI)
,
Chen, Yi-Fan
;
Yang, Fu-Sheng
;
Su, Eugene
. - p. 1-4 , 2019
Link:
https://doi.org/10.1109/ICESI.2019.8863029
RT T1 <cTitle>2019 International Conference on Engineering, Science, and Industrial Applications (ICESI)</cTitle>: T1 <Title>Automatic Defect Detection System Based on Deep Convolutional Neural Networks</Title> UL https://suche.suub.uni-bremen.de/peid=ieee-8863029&Exemplar=1&LAN=DE A1 Chen, Yi-Fan A1 Yang, Fu-Sheng A1 Su, Eugene A1 Ho, Chao-Ching YR 2019 SN 2521-3814 K1 Convolutional neural networks K1 Lighting K1 Training K1 Deep learning K1 Labeling K1 Automatic optical inspection K1 Convolution K1 Deep Convolutional Neural Networks K1 Defect Detection K1 Automated Optical Inspection SP 1 OP 4 LK http://dx.doi.org/https://doi.org/10.1109/ICESI.2019.8863029 DO https://doi.org/10.1109/ICESI.2019.8863029 SF ELIB - SuUB Bremen
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