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Viable 3C-SiC-on-Si MOSFET design disrupting current Materi..:

, In: 2019 IEEE 12th International Symposium on Diagnostics for Electrical Machines, Power Electronics and Drives (SDEMPED),
Arvanitopoulos, A. ; Antoniou, M. ; Li, F.... - p. 364-370 , 2019
Link: https://doi.org/10.1109/DEMPED.2019.8864910